Spectrum-enhanced graph attention network for garment mesh deformation

Published in IEEE Transactions on Pattern Analysis and Machine Intelligence, 2025

Recommended citation: Tianxing Li, Rui Shi, Qing Zhu, Liguo Zhang, Takashi Kanai. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2025, 47(8): 7153-7170. /files/pdf/research/202505SEGA-TPAMI.pdf